Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...
Reexamination Certificate
2005-08-03
2009-08-18
Picardat, Kevin M (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Field effect device in non-single crystal, or...
C257S072000, C257S075000
Reexamination Certificate
active
07576361
ABSTRACT:
Imaging devices having reduced image artifacts are disclosed. The image artifacts in the imaging devices are reduced by redirecting, absorbing or scattering IR radiation that passes through the imaging device substrate away from dark pixels.
REFERENCES:
patent: 3971065 (1976-07-01), Bayer
patent: 4365259 (1982-12-01), Schroder
patent: 4789648 (1988-12-01), Chow et al.
patent: 4956313 (1990-09-01), Cote et al.
patent: 5137544 (1992-08-01), Medellin
patent: 5157876 (1992-10-01), Medellin
patent: 5209816 (1993-05-01), Yu et al.
patent: 5244523 (1993-09-01), Tollini
patent: 5340370 (1994-08-01), Cadien et al.
patent: 5354490 (1994-10-01), Yu et al.
patent: 5391258 (1995-02-01), Brancaleoni et al.
patent: 5471515 (1995-11-01), Fossum et al.
patent: 5476606 (1995-12-01), Brancaleoni et al.
patent: 5527423 (1996-06-01), Neville et al.
patent: 5783489 (1998-07-01), Kaufman et al.
patent: 5942771 (1999-08-01), Ishimura
patent: 5954997 (1999-09-01), Kaufman et al.
patent: 5993686 (1999-11-01), Streinz et al.
patent: 6015506 (2000-01-01), Streinz et al.
patent: 6033596 (2000-03-01), Kaufman et al.
patent: 6039891 (2000-03-01), Kaufman et al.
patent: 6063306 (2000-05-01), Kaufman et al.
patent: 6068787 (2000-05-01), Grumbine et al.
patent: 6121143 (2000-09-01), Messner et al.
patent: 6175442 (2001-01-01), Booth et al.
patent: 6333205 (2001-12-01), Rhodes
patent: 6376868 (2002-04-01), Rhodes
patent: 6420691 (2002-07-01), Loh et al.
patent: 6444588 (2002-09-01), Holscher et al.
patent: 6614085 (2003-09-01), Hu
patent: 6713404 (2004-03-01), Hishiro
patent: 6753584 (2004-06-01), Hu
patent: 6767689 (2004-07-01), Pavelchek et al.
patent: 6783900 (2004-08-01), Venkataraman
patent: 6869747 (2005-03-01), Sabnis et al.
patent: 6887648 (2005-05-01), Pavelchek et al.
patent: 2001/0012067 (2001-08-01), Spitzer et al.
patent: 2002/0158294 (2002-10-01), Fujiwara et al.
patent: 2004/0004254 (2004-01-01), Watanabe
patent: 2005/0134769 (2005-06-01), Mi
patent: 0 186 044 (1986-07-01), None
patent: 0 608 932 (1994-08-01), None
patent: 63-161667 (1988-07-01), None
patent: 02-094566 (1990-04-01), None
Partial International Search Report dated Jul. 10, 2007.
Agranov Gennadiy A.
Karasev Igor
Aptina Imaging Corporation
Dickstein & Shapiro LLP
Picardat Kevin M
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