Backmatch resistor structure for an integrated circuit tester

Details Backmatch resistor structure for an integrated circuit tester Backmatch resistor structure for an integrated circuit tester

1997-10-31

1999-09-21

Nelms, David

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Bus or line termination

3241581, 324765, H03K 1716

Patent

active

059558903

ABSTRACT:
A drive arrangement for a semiconductor integrated circuit tester having a tester pin connected by a transmission line to a terminal for engaging a pin of a semiconductor device under test (DUT) includes a driver having an output terminal which can be driven selectively to at least two voltage levels in response to a timing signal and multiple semiconductor resistive elements each having at least a first state, in which the resistive element is conductive, and a second state, in which the resistive element is substantially non-conductive. The resistive elements are connected as a two-terminal network between the output terminal of the driver and the tester pin. By selective control, the resistive elements can backmatch the characteristic impedance of the transmission line.

REFERENCES:
patent: 5453993 (1995-09-01), Kitaguchi et al.
patent: 5521493 (1996-05-01), Persons
patent: 5760599 (1998-06-01), Ehiro

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