Avalanche fuse element with isolated emitter

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357 35, 357 51, 357 53, H01L 2970, H01L 2986, H01L 2978

Patent

active

044918577

ABSTRACT:
A programmable device is provided by a thin-oxide avalanche fuse element which is programmed at a voltage below the oxide breakdown level. This device may be used to fix the addresses of faulty rows or columns in a memory having redundant or substitute cells. Upon breakdown, the thin oxide is perforated by small holes which fill with silicon to create short circuits. The source or emitter of the transistor device may be separated from the drain and gate by thick field oxide.

REFERENCES:
patent: 4350992 (1982-09-01), Tubbs
patent: 4399523 (1983-08-01), Gerber et al.
"Electrically Alterable Avalanche-Injection-Type, MOS Read Only Memory, with Stacked Gate Structure"--Iizuka et al.,--IEEE Transactions on Electron Devices--vol. ED-23-4-1976--pp. 379-387.
1024-Bit MNOS RAM Using Avalanche Tunnel Injection, Uchida et al.--IEE Journal of Solid State Circuits--vol. SC10 No. 5, pp. 288-293, Oct. 1975.

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