Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-01-28
1989-02-21
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Plural, automatically sequential tests
324 73AT, 371 27, 371 62, G01R 1900, G01R 1925
Patent
active
048068527
ABSTRACT:
A unique automatic test system (100) is provided in which timing signals are generated in a novel manner as compared with prior art test systems. All adjustments for propagation delays of timing signals are made in a digital fashion, by adjusting the digital information which defines when an analog timing signal is to be generated. Deskewing of propagation delays is performed automatically under computer control, rather than by requiring careful adjustment of hardware deskewing elements. By adjusting for propagation skews digitally, propagation skews dependent on data values (logical 0 and logical 1) can be made. Furthermore, timing signals are provided by three timing edges, rather than by a timing pulse, thereby allowing more accurate generation of timing signals. The use of a complex switching matrix is eliminated by providing at least one timing generator per pin of the device under test, thereby eliminating complex hardware, propagation errors related to switching matrices, and providing enhanced capabilities for the user while simultaneously simplifying the problems associated with creating software used to control the test system during testing a device under test.
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"Logic Checking Device", by Abrams, IBM Tech. Disc. Bull., vol. 2 #6, 4/60, p. 60, cl. 371-62.
"Why and How Users Use Microprocessors", by Scrupski, Electronics, 3/2/78, pp. 97-104.
Catalano Mike
Feldman Richard
Swan Richard
Burns W.
Eisenzopf Reinhard J.
MacPherson Alan H.
Megatest Corporation
Ogonowsky Brian D.
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