Automatic test system with easily modified software

Details Automatic test system with easily modified software Automatic test system with easily modified software

2007-01-30

2007-01-30

Bonzo, Bryce P. (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S742000, C702S121000

Reexamination Certificate

active

10460104

ABSTRACT:
An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactured. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes from tester to tester in a product family.

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