Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-20
2005-12-20
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06978431
ABSTRACT:
A redundancy detection unit refers to layout data stored in a data storage unit and reflecting completed automatic placement and routing to detect a redundant region in a region having a cell arranged therein. An automatic insertion unit inserts in the detected redundant region a capacitive cell having a capacitive component and free of logic. As such a voltage drop can be reduced in a region scarce of LSI wiring resources. Furthermore, increased wiring capacitance can be provided without increased LSI chip area.
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Hirakimoto Koji
Inoue Yoshio
Buchanan & Ingersoll PC
Doan Nghia M.
Renesas Technology Corp.
Thompson A. M.
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