Automatic method and system for instantiating built-in-test...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

06931606

ABSTRACT:
A method and system for automatically instantiating built-in-system test (BIST) modules in memory designs is disclosed. The method and system include providing a server over a network that integrates a set of design tools, including an automated front-end software process and an automated back-end software process. According to the method and system, a user may access the server over the network and enter a request for a memory design. The front-end software process is then executed to automatically generate a netlist of a BIST from the user request. Thereafter, the back-end software process is executed to automatically generate a placement and route view of the BIST.

REFERENCES:
patent: 5572712 (1996-11-01), Jamal
patent: 5796623 (1998-08-01), Butts et al.
patent: 6493855 (2002-12-01), Weiss et al.
patent: 6578174 (2003-06-01), Zizzo
patent: 6594799 (2003-07-01), Robertson et al.
patent: 6633999 (2003-10-01), Lee
patent: 6634008 (2003-10-01), Dole
patent: 6728916 (2004-04-01), Chen et al.
patent: 2002/0108006 (2002-08-01), Snyder
patent: 2003/0055520 (2003-03-01), Tomii
patent: 2003/0188208 (2003-10-01), Fung

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