Automatic manufacturing test case generation method and system

Details Automatic manufacturing test case generation method and system Automatic manufacturing test case generation method and system

2005-04-19

2005-04-19

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

06883150

ABSTRACT:
Automatic manufacturing test case generation mechanism receives a plurality of design verification test cases (DVTCs) from one or more sources and based thereon automatically generates manufacturing test cases (MTCs). Each of the manufacturing test cases (MTCs) generated by the automatic manufacturing test includes at least a first design verification test case and a second design verification test case.

REFERENCES:
patent: 6363509 (2002-03-01), Parulkar et al.
patent: 6490711 (2002-12-01), Buckley, Jr.

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