Automatic grammar based fault detection and isolation

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Details

C714S025000

Reexamination Certificate

active

08006136

ABSTRACT:
The present disclosure relates to automated testing of hardware and software systems. In some embodiments, a testing framework that generates a set of test cases for a system under test using a grammar is disclosed. The grammar may include terminal and nonterminal symbols with tags that describe a test sequence. The testing framework can use the grammar to generate a set of test cases. The testing framework can then receive feedback about the execution of the set of test cases from the system under test. In response to the feedback, the testing framework can generate a new set of grammars by automatically modifying or inserting tags in the original grammar. The new set of grammars can then be used to generate further test cases that intelligently explore the system under test for correctness, conformance, performance, security, or reliability.

REFERENCES:
patent: 5724273 (1998-03-01), Desgrousilliers et al.
patent: 5913023 (1999-06-01), Szermer
patent: 6125457 (2000-09-01), Crisan et al.
patent: 7480900 (2009-01-01), Zhou et al.
patent: 2001/0054174 (2001-12-01), Boggs et al.
patent: 2003/0051163 (2003-03-01), Bidaud
patent: 2006/0090100 (2006-04-01), Holzapfel et al.
patent: 2006/0184928 (2006-08-01), Hughes
patent: 2007/0220342 (2007-09-01), Vieira et al.
patent: 2008/0115112 (2008-05-01), Sharma
patent: 2008/0184206 (2008-07-01), Vikutan
patent: 2006106502 (2006-10-01), None
Model-Based Testing of a Highly Programmable System, Software Reliability Engineering, 1998 Proceedings of the Ninth Symposium on Nov. 4-7, 1998, pp. 174-179.
Using Attributed Event Grammar Environment Models for Automated Test Generation and Software Risk Assessment of System-of-Systems, Systems, Man and Cybernetics, 2005 IEEE International Conference, vol. 2, pp. 1870-1875.
Bird, D.L., and C.U. Munoz, Automatic Generation of Random Self-Checking Test Cases, IBM Systems Journal 22 (3),1983, pp. 229-245.
Hanford, K.V., Automatic Generation of Test Cases, IBM Systems Journal 9(4):242-257, 1970.
Lammel, R., and W. Schulte, Controllable Combinatorial Coverage in Grammar-Based Testing, Proceedings of the 18th IFIP TC6/WG6.1 International Conference, TestCom 2006, New York, New York, May 16-18, 2006.
Sirer, E.G., and B.N. Bershad, Using Production Grammars in Software Testing, Second Conference on Domain Specific Languages, Austin, Texas, Oct. 3-5, 1999, pp. 1-13.

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