Automatic generation of test cases from error data

Details Automatic generation of test cases from error data Automatic generation of test cases from error data

2006-11-27

2010-11-30

Baderman, Scott T (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

07844861

ABSTRACT:
Some embodiments of a method and apparatus for automatically generating test cases from error data have been presented. In one embodiment, the method includes providing a graphical user interface (GUI) to allow a user to submit a report of an error in a program. The report may be partially written in a natural language. Further, the method may include receiving the report from the user via the GUI and processing the report to generate a test case to reproduce the error.

REFERENCES:
patent: 6202174 (2001-03-01), Lee et al.
patent: 6418543 (2002-07-01), Goli et al.
patent: 6601018 (2003-07-01), Logan
patent: 2003/0041052 (2003-02-01), Gajda et al.
patent: 2003/0086536 (2003-05-01), Salzberg et al.
patent: 2004/0249914 (2004-12-01), Flocken et al.
patent: 2004/0250220 (2004-12-01), Kalenius
patent: 2005/0075831 (2005-04-01), Ilic
patent: 2006/0161414 (2006-07-01), Carignano et al.
patent: 2006/0168569 (2006-07-01), Smith et al.
patent: 2006/0259499 (2006-11-01), Moulckers et al.
patent: 2008/0072187 (2008-03-01), Drasny et al.
lift:LIFT, Project Home. https://lift.dev.java.net/ Sep. 28, 2007. 3 pages.
lift: LIFT—Introduction, https://lift.dev.java.net/introduction.html. Sep. 28, 2007. 3 pages.
Bugzilla Main Page. https://bugzilla.redhat.com/bugzilla/index.cgi. Oct. 23, 2007. 3 pages.
Bug 211652: crash generates floating point assist faults on ia64.. https://bugzilla.redhat.com/bugzilla/show—bug.cgi?id+211652. Oct. 23, 2007. 5 pages.

Affiliated with

Also associated with

Rating

Automatic generation of test cases from error data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic generation of test cases from error data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic generation of test cases from error data will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4157485