Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1977-11-15
1979-06-19
Corbin, John K.
Optics: measuring and testing
By polarized light examination
With birefringent element
G01J 404
Patent
active
041585062
ABSTRACT:
An electro-optical system for determining the polarization state of optical pulses of nanosecond durations such as produced by lasers. This is achieved by using a six element optical polarizer assembly positioned in front of a six element optical detector assembly. The respective outputs of the six detectors are fed in predetermined arrangement to a plurality of operational amplifiers which are adapted to provide the sum/difference of the detector outputs for providing the Stokes parameters of an optical pulse incident thereto.
REFERENCES:
born et al., Principles of Optics, Pergamon Press, New York, 1959, p. 551.
Dill et al., "Ellipsometry with Pulsed Tunable Laser Sources," IBM Techni Disclosure Bulletin, vol. 19, No. 4, Sep. 1976, pp. 1487-1489.
Corbin John K.
Edelberg Nathan
Franz Bernard
Kanars Sheldon
Rosenberger R. A.
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