Automated test generation

Details Automated test generation Automated test generation

2006-01-31

2006-01-31

Baderman, Scott (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C717S124000

Reexamination Certificate

active

06993682

ABSTRACT:
A system and method for automated FVT test generation by distributed processing among a master (100) and one or more slave (200) JVMs which communicate via RMI. Using reflection analysis, the master (100) sequentially tests each of a plurality of classes, instructs the slave to test each of the plurality of classes, compares the results of the testing at the master and slave and in dependence thereon adds the class to a pool (110) of classes for subsequent use. This provides the advantage that the test application may be set running and allowed to continue automatically. The more objects that are serialised, the more variations and permutations can be tested and theoretically, there is no limit to the amount of testing that can be done. Rather than having a static set of tests that are run over and over, the tests are constantly changing which increases the likelihood of finding bugs.

REFERENCES:
patent: 5652835 (1997-07-01), Miller
patent: 5905856 (1999-05-01), Ottensooser
patent: 6223337 (2001-04-01), Blume
patent: 2003/0005380 (2003-01-01), Nguyen et al.
patent: 2005/0022166 (2005-01-01), Wolff et al.

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