Automated noise convergence for cell-based integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

10737186

ABSTRACT:
According to some embodiments, a noise problem is automatically analyzed within the context of a cell-based integrated circuit design to identify an adjustment to the design in view of the perturbation to the design caused by the adjustment.

REFERENCES:
patent: 6363516 (2002-03-01), Cano et al.
patent: 6389581 (2002-05-01), Muddu et al.
patent: 6490708 (2002-12-01), Cohn et al.
patent: 6507935 (2003-01-01), Aingaran et al.
patent: 6675118 (2004-01-01), Wanek et al.
patent: 6732346 (2004-05-01), Horne et al.
patent: 6832180 (2004-12-01), Sutera et al.
patent: 7058907 (2006-06-01), Tuncer et al.
patent: 7086018 (2006-08-01), Ito
patent: 7111259 (2006-09-01), Casavant

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