Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-01-10
2006-01-10
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S016000, C703S026000, C703S027000, C703S028000, C717S128000, C717S135000, C707S793000, C707S793000, C707S793000
Reexamination Certificate
active
06986110
ABSTRACT:
Method and system for automatically backtracing through a testcase file. First the testcase file is accessed. Next, a start line identifier for specifying an instruction line in the testcase file at which to begin processing is received. The instruction line in the testcase file that is specified by the start line identifier is processed first. The previous instruction lines in the testcase file are then processed in a sequential fashion until the beginning of the testcase file is reached.
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Maly John W.
Thompson Ryan C.
Kik Phallaka
Smith Matthew
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