Image analysis – Applications – Manufacturing or product inspection
Patent
1993-10-22
1996-08-06
Couso, Jose L.
Image analysis
Applications
Manufacturing or product inspection
382159, 395900, G06K 900, G06K 962, G06G 700
Patent
active
055442560
ABSTRACT:
An integrated visual defect detection and classification system. The invention includes adaptive defect detection and image labeling, defect feature measures, and a knowledge based inference shell/engine for classification based on fuzzy logic. The combination of these elements comprises a method and system for providing detection and analysis of product defects in many application domains, such as semiconductor and electronic packaging manufacturing.
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Brecher Virginia H.
Chou Paul B.-L,
Hall Robert W.
Parisi Debra M.
Rao Ravishankar
Bolla Matthew C.
Couso Jose L.
International Business Machines - Corporation
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