Electrical computers and digital data processing systems: input/ – Intrasystem connection – Protocol
Reexamination Certificate
2005-09-13
2005-09-13
Dang, Khanh (Department: 2111)
Electrical computers and digital data processing systems: input/
Intrasystem connection
Protocol
C714S700000, C713S503000
Reexamination Certificate
active
06944692
ABSTRACT:
A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
REFERENCES:
patent: 4928278 (1990-05-01), Otsuji et al.
patent: 5712855 (1998-01-01), Goto et al.
patent: 5935257 (1999-08-01), Nishimura
patent: 5978742 (1999-11-01), Pickerd
patent: 6028451 (2000-02-01), Ruff
patent: 6041419 (2000-03-01), Huang et al.
patent: 6326830 (2001-12-01), Brady et al.
patent: 6546343 (2003-04-01), Batra et al.
patent: 6560716 (2003-05-01), Gasparik et al.
patent: 6606575 (2003-08-01), Miller
patent: 6622107 (2003-09-01), West
patent: 6684350 (2004-01-01), Theodoras et al.
Application Specific Integrated Circuits, Addison Wesley Longman Inc., section 14.7, 1997.
European Search Report for 02256425.6-2212-,Feb. 17, 2003, 3 pages.
Chakrabarti Prabhansu
Fong Wai
Jong Jyh-Ming
Smith Brian L.
Wu Jue
Dang Khanh
Heter Erik A.
Kivlin B. Noäl
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Microsystems Inc.
LandOfFree
Automated calibration of I/O over a multi-variable eye window does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Automated calibration of I/O over a multi-variable eye window, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automated calibration of I/O over a multi-variable eye window will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3366663