Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-05-01
2007-05-01
Chu, Gabriel L. (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S057000, C709S224000
Reexamination Certificate
active
10762087
ABSTRACT:
The present invention provides automated kernel software outage measurement and classification. System failures are categorized into software-caused failures and hardware-caused failures. Software failures are further classified as unplanned outages and operational outages. The operational outages are then classified as unplanned operational outages and planned operational outages.
REFERENCES:
patent: 5790431 (1998-08-01), Ahrens et al.
patent: 5822578 (1998-10-01), Frank et al.
patent: 6594786 (2003-07-01), Connelly et al.
patent: 6747957 (2004-06-01), Pithawala et al.
patent: 6830515 (2004-12-01), Rowe
patent: 2002/0143920 (2002-10-01), Dev et al.
patent: 2003/0172153 (2003-09-01), Vaver
patent: 2004/0078695 (2004-04-01), Bowers et al.
patent: 2004/0230872 (2004-11-01), Mullally et al.
Ali, “Analysis of Total Outage Data for Stored Program Control Switching Systems”, 1986, IEEE, pp. 1044-1046.
Sejun Song and Jim Huang, “Patent Disclosure Software Reliability Measurement and Classification”, Jul. 9, 2003, pp. 1-7.
Sejun Song and Jim Huang, “IOS Software MTBF Measurement”, May 28, 2003, pp. 1-28.
Huang Jiandong
Song Sejun
Chu Gabriel L.
Cisco Technology Inc.
Marger & Johnson & McCollom, P.C.
LandOfFree
Automated and embedded software reliability measurement and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Automated and embedded software reliability measurement and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automated and embedded software reliability measurement and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3806002