Optics: measuring and testing – Shape or surface configuration – By focus detection
Reexamination Certificate
2008-03-04
2010-11-16
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
By focus detection
Reexamination Certificate
active
07835015
ABSTRACT:
Methods and apparatus relating to the inspection of photomasks are described. In an embodiment, an inspection tool may be automatically focused on a reticle utilizing various topographic mapping techniques. Other embodiments are also described.
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Alles David S.
Belin Daniel L.
Walsh Robert W.
Wright Michael J.
KLA-Tencor Corporation
Luedeka Neely & Graham P.C.
Nguyen Sang
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