Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-09-25
2007-09-25
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11159915
ABSTRACT:
A system and method for generating simulated wiring connections between first I/O terminals of a semiconductor device and second I/O terminals of a carrier. The method comprises identifying a plurality of first factors and instances of each first factor relating to a semiconductor device and identifying a plurality of second factors and instances of each second factor relating to a carrier. The first and second factors are associated with each other on a one-to-one basis. The instances of each first factor are correlated to the instances of each associated second factor on a one-to-one basis. A simulated wiring connection automatically is generated between each first I/O terminal and a matching second I/O terminal, subject to an identified instance of each first factor of each first I/O terminal being correlated to an identified instance of the associated second factor of the matching second I/O terminal.
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Bittner Adam Matthew
Budell Timothy W.
Cusimano Robert C.
Dauphin Richard
Guzowski Matthew Thomas
International Business Machines - Corporation
Lin Sun James
Schmeiser Olsen & Watts
Steinberg William H.
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