Attachment of integrated circuit structures and other...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S106000, C438S107000, C438S108000, C257SE21511

Reexamination Certificate

active

11253492

ABSTRACT:
Vias (210, 210B) are formed in a surface of a substrate. At least portions of contact pads (139, 350) are located in the vias. Contact pads (150, 340) of an integrated circuit structure are inserted into the vias and attached to the contact pads (139, 350) of the substrate. The vias provide a strong, reliable mechanical and electrical connection. A via may expose not only a contact pad (350) in the substrate but also a surrounding region. Solder (930) wets the contact pad better than the surrounding region, resulting in a stronger solder joint and better electrical conductivity. Alternatively, the contact may include multiple conductive layers (910.1, 910.2), with the top layer (910.2) being more solder wettable than the bottom layer (910.1) and the top layer covering only a portion of the bottom layer.

REFERENCES:
patent: 5391514 (1995-02-01), Gall et al.
patent: 5611140 (1997-03-01), Kulesza et al.
patent: 6163456 (2000-12-01), Suzuki et al.
patent: 6165885 (2000-12-01), Gaynes et al.
patent: 6175158 (2001-01-01), Degani et al.
patent: 6190940 (2001-02-01), DeFelice et al.
patent: 6322903 (2001-11-01), Siniaguine et al.
patent: 6498074 (2002-12-01), Siniaguine et al.
patent: 6498381 (2002-12-01), Halahan et al.
patent: 6661088 (2003-12-01), Yoda et al.
patent: 6903443 (2005-06-01), Farnworth et al.
patent: 2001/0019178 (2001-09-01), Brofman et al.
patent: 2002/0036340 (2002-03-01), Matsuo et al.
patent: 2002/0048916 (2002-04-01), Yangida
patent: 2002/0074637 (2002-06-01), McFarland
patent: 2002/0175421 (2002-11-01), Kimura
patent: 2003/0047798 (2003-03-01), Halahan
patent: 2003/0080437 (2003-05-01), Gonzalez et al.
patent: 2003/0116859 (2003-06-01), Hashimoto
patent: 2003/0199123 (2003-10-01), Siniaguine
patent: 2004/0087057 (2004-05-01), Wang et al.
patent: 195 31 158 (1997-02-01), None
patent: 0 193 128 (1986-09-01), None
patent: 08-236579 (1996-09-01), None
patent: WO 01/45476 (2001-06-01), None
Ekstrom; Bjorn “Thin Film Silicon Substrates For Lead Frame Packages” Advancing Microelectronics—May/Jun. 2003, pp. 6-7.
200mm Wafer Fab Strand Interconnect, Partner for High Performance Electronics.
Chapter 7: Wedge and Double Cantilever Beam Tests on a High Temperatue Melt Processable Polymide Adhesive, TPER-BPDA-PA, pp. 221-242.
Design Notes: Understanding Ball Grid Array Packages Electronics by Design, www.electronicsbydesign.com.au, issue 1997.10, pp. 1-4.
Flip Chip Bonding in Practice Issue No. 7, Sep. 2001, The Micro Circuit Engineering Newsletter.
Gektin, Vadim; Bar-Cohen, Avram; Witzman, Sorin “Coffin-Mason Based Fatigue Analysis of Underfilled DCAs,” 1998 IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, vol. 21, No. 4, Dec. 1998, pp. 577-584.
Gilleo, Ken “Substrates for Flip Chips” “Flip Chips Technology” in Area Array Packaging Handbook—Manufacturing and Assembly; K Gillio, Editor; The McGraw-Hill Companies, Inc., New York, NY.
Guenin, Bruce M. “The Many Flavors of Ball Grid Array Packages” Electronics Cooling, Feb. 2002, pp. 1-7.
HPMX-5001: Demonstration Circuit Board: Application Brief 102 Hewlett Packard, pp. 1-10.
Introduction to Printed Wiring Boards Netpack Education Pool, p. 1-18.
Jasper, Jorg “Gold or Solder Chip Bumping, the choice is application dependent” Chip Interconnection, EM Marin, pp. 1-4.
Jordan, Jerry “Gold Stud Bump In Flip-Chip Applicatins,” 2002 Palomar Technologies, Inc.
Lu, H. and Bailey, C. “Predicting Optimal Process Conditions for Flip-Chip Assembly Using Copper Column Bumped Dies” School of Computing and Mathematical Sciences, 2002 IEEE, 2002 Electronics Packaging Technology Conference, pp. 338-343.
Maiwald, Werner “soldering SMD's Without Solder Paste” http://www.midwestpcb.com/sales/Kehoe/maiwald.htm.
Moon, K.W.; Boettinger, W.J.; Kattner, U.R.; Biancaniello, F.S.; Handwerker, C.A. “The Ternary Eutectic of Sn-Ag-Cu Colder Alloys” Metallury Division, Materials Science and Engineering Laboratory NIST Gaithersburg, MD 20899 USA.
Painaik, Mandar; and Hurley, Jim “Process Recommendations for Assemby of Flip Chips Using No-Flow Underfill” Semiconductor Products, Technical Bulletin, www.cooksonsemi.com.
Pang, John H.L.; Chong, D.Y.R.; Low T.H. “Thermal Cycling Analysis of Flip-Chip Solder Joint Reliability” IEEE Transactions on Components and Packaging Technologies, vol. 24, No. 4, Dec. 2001, pp. 705-712.
Perfecto, Eric; Lee, Kang-Wook; Hamel, Harvey; Wassick, Thomas; Cline, Christopher; Oonk, Matthew; Feger, Claudius; McHerron, Dale, “Evaluation of Cu Capping Alternatives for Polymide-Cu MCM-D” IEEE, 2001 Electronic Components and Technology Conference.
Productions Qualification Report: Select Qual B: Strand Substrate on MCM MQFP Qual Amkor Technology, Date Released: Jun. 14, 2002.
Solving Soldering Hierarchy Problems by Metallurgy and Design IBM Technical Disclosure Bulletin, IBM Corp. New York, US, vol. 33, No. 8, Jan. 1991, pp. 298-299, XP000106967, ISSN: 0018-8689.
Sperling, Ed; Electronics News, Sep. 17, 2003.
Staychip; 2078E No-Flow Fluxing Underfill; For Solding Sn/Pb eutectic solder bumps to common pad metallizations Preliminary Technical Bulletin Semiconductor Products, Technical Bulletin; Cookson Electronics.
Strand is Closing the Enterprise Strand Interconnect AB, Viggengatan5, SE-602 09 Norrkoping Sweden, www.strandinter.se.
Technical Data Sheet: No-Clean Pin-Probe Testable Solder Paste: NC253 www.aimsolder.com.
Tran, S.K.; Questad, D.L.; Sammakia, B.G. “Adhesion Issues in Flip-Chip on Organic Modules,” 1998 InterSociety Conference on Thermal Phenomena, pp. 263-268.
U.S. Appl. No. 10/739,707, entitled “Packaging Substrates For Integrated Circuits and Soldering Methods,” filed on Dec. 17, 2003.
U.S. Appl. No. 10/798,540, entitled “Attachment of Integrated Circuit Structures and Other Substrates to Substrates with Vias,” filed on Mar. 10, 2004.
Wang, C.H.; Holmes, A.S.; Gao, S. “Laser-Assisted Bump Transfer for Flip Chip Assembly,” 2000 IEEE Int'l Symp on Electronic Materials & Packaging, pp. 86-90.
Wang, Tie; Tung, Francisca; Foo, Louis; and Dutta, Vivek “Studies on A Novel Flip-Chip Interconnect Structure—Pillar Bump” Advanpack Solutions Pte Ltd, 2001 IEEE, 2001 Electronic Components and Technolgoy Conference.
www.flipchips.com/tutorial27.html “Flipchips: Tutorial 27, Shaping Gold Stud Bumps” pp. 1-8.
Zama, Satoru; Baldwin, Daniel F; Hikami, Toshiya; Murata, Hideaki “Flip Chip Interconnect Systems Using Wire Stud Bumps and Lead Free Solder,” 2000 IEEE Electronic Components and Technology Conference, pp. 1111-1117.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Attachment of integrated circuit structures and other... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Attachment of integrated circuit structures and other..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Attachment of integrated circuit structures and other... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3751079

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.