Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-06-12
2010-02-09
Masinick, Michael D (Department: 2128)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C438S478000, C118S719000, C118S729000
Reexamination Certificate
active
07660644
ABSTRACT:
A method and apparatus for atomic layer deposition (ALD) is described. The apparatus comprises a deposition chamber and a wafer support. The deposition chamber is divided into two or more deposition regions that are integrally connected one to another. The wafer support is movable between the two or more interconnected deposition regions within the deposition chamber.
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Byun Jeong Soo
Chin Barry L.
Chung Hua
Lai Ken Kaung
Lei Lawrence Chung-Lai
Applied Materials Inc.
Masinick Michael D
Patterson & Sheridan LLP
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