Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate
2006-01-24
2006-01-24
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
C250S307000, C250S305000, C427S127000, C427S387000
Reexamination Certificate
active
06989535
ABSTRACT:
To provide an atomic force microscopy which allows the measurement of the configuration of a surface being measured by using the phenomenon observed between the surface being measured and a probe approaching thereto at very fine distance.By selecting the material of the tip surface of said probe such that the surface energy of said probe tip becomes less than the interface energy between the tip surface and the surface being measured, thereby the surface configuration of soft body, or soft fouling adhered to the body surface can be measured.A method of measuring the surface configuration and a method of producing magnetic recording medium using the same are also provided.
REFERENCES:
patent: 4835070 (1989-05-01), Kurokawa et al.
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5425988 (1995-06-01), Ogawa et al.
patent: 5602330 (1997-02-01), Chamberlin et al.
patent: 5753814 (1998-05-01), Han et al.
patent: 5843561 (1998-12-01), Uwazumi et al.
patent: 5914151 (1999-06-01), Usuki
patent: 6033738 (2000-03-01), Teranishi et al.
patent: 6071609 (2000-06-01), Furutani et al.
patent: 6249403 (2001-06-01), Tokisue et al.
patent: 6249503 (2001-06-01), Aratani
patent: A 4-12547 (1992-01-01), None
patent: 5-164514 (1993-06-01), None
patent: 6-088723 (1994-03-01), None
patent: A 6-264217 (1994-09-01), None
patent: A 6-267109 (1994-09-01), None
patent: A 7-121916 (1995-05-01), None
patent: A 7-130013 (1995-05-01), None
patent: 7-192255 (1995-07-01), None
patent: A 7-192255 (1995-07-01), None
patent: 7-325090 (1995-12-01), None
patent: 2500373 (1996-03-01), None
patent: 8-193341 (1996-07-01), None
patent: 10-90287 (1998-04-01), None
Journal of Japanese Society of Tribologists, vol. 42, No. 4, 1997, p. 251-256 including an English translation thereof.
Inoue Masanori
Ogawa Yoko
Shirakura Takaaki
Sonoda Koji
Tani Hiroshi
Kenyon & Kenyon
Quash Anthony
Wells Nikita
LandOfFree
Atomic force microscopy, method of measuring surface... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Atomic force microscopy, method of measuring surface..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic force microscopy, method of measuring surface... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3533706