Atomic force microscope using piezoelectric detection

Radiant energy – Inspection of solids or liquids by charged particles

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250307, H01J 3726

Patent

active

055742785

ABSTRACT:
A method and apparatus detects surface properties of a sample surface using n atomic force microscope. The atomic force microscope includes a piezoelectric tube mounted on a rigid surface and separated into actuator and sensor segments. The sensor segments detect interatomic force information without snap-in effects common with cantilever mounts. A probe tip is mounted on the sensor section of the piezoelectric tube. The probe tip interacts with the interatomic forces of the sample surface. Supporting circuitry is used in either current feedback or force feedback modes.

REFERENCES:
patent: 4724318 (1988-02-01), Binnig
patent: 4851671 (1989-07-01), Pohl
patent: 5128544 (1992-07-01), Iwatsuki
patent: 5172002 (1992-12-01), Marshall
patent: 5173605 (1992-12-01), Hayes et al.
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5196701 (1993-03-01), Foster et al.
patent: 5196713 (1993-03-01), Marshall
patent: 5198715 (1993-03-01), Elings et al.
patent: 5210410 (1993-05-01), Barrett
patent: 5237859 (1993-08-01), Elings et al.
patent: 5254854 (1993-10-01), Betzig
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5321685 (1994-06-01), Nose et al.
patent: 5431055 (1995-07-01), Takata et al.

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