Atomic force microscope

Details Atomic force microscope Atomic force microscope

2006-09-08

2008-09-09

Souw, Bernard E (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

C250S307000, C250S442110, C073S104000, C073S105000

Reexamination Certificate

active

07423264

ABSTRACT:
In one embodiment, an atomic force microscope comprises a frame, a beam coupled to the frame at a first end and a second end, a probe mounted to the beam, means for inducing relative motion between the beam and an underlying surface, and means for detecting a characteristic of the beam.

REFERENCES:
patent: 4800274 (1989-01-01), Hamsa
patent: 4902892 (1990-02-01), Okayama
patent: 5047633 (1991-09-01), Finlan
patent: 5092163 (1992-03-01), Young
patent: 5162653 (1992-11-01), Hosaka
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5345816 (1994-09-01), Clabes
patent: 5595942 (1997-01-01), Albrecht
patent: 5750989 (1998-05-01), Lindsay et al.
patent: 5763767 (1998-06-01), Jung et al.
patent: 5952657 (1999-09-01), Alexander
patent: 6530268 (2003-03-01), Massie
patent: 6612160 (2003-09-01), Massie et al.
patent: 2002/0124636 (2002-09-01), Massie et al.
patent: 2002/0125415 (2002-09-01), Massie
patent: 2003/0160170 (2003-08-01), McMaster et al.
patent: 2003/0209060 (2003-11-01), Proksch
patent: 2004/0079142 (2004-04-01), Proksch
patent: 2007/0158552 (2007-07-01), Kim et al.
patent: 2007/0215804 (2007-09-01), Suzuki et al.
patent: 2008/0060426 (2008-03-01), Bevis et al.
patent: 2008/0061230 (2008-03-01), Wang et al.

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