Asymmetrical memory cells and memories using the cells

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

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C365S155000, C365S156000

Reexamination Certificate

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07903450

ABSTRACT:
Asymmetrical SRAM cells are improved by providing one or more of improved read stability and improved write performance and margin. A first inverter and a second inverter are cross-coupled and configured for selective coupling to true and complementary bit lines under control of read and write word lines. The first inverter is formed by a first, n-type, FET (NFET) and a second, p-type, FET (PFET). Process and/or technology approaches can be employed to adjust the relative strength of the FETS to obtain, for example, read margin, write margin, and/or write performance improvements.

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