Arsenic and phosphorus doped silicon wafer substrates having...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S288000, C257SE21320, C257SE21275, C257SE21321, C257SE21435

Reexamination Certificate

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07485928

ABSTRACT:
A process for the preparation of low resistivity arsensic or phosphorous doped (N+/N++) silicon wafers which, during the heat treatment cycles of essentially any arbitrary electronic device manufacturing process, reliably form oxygen precipitates.

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