Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-01-06
2008-08-05
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07408376
ABSTRACT:
In an array substrate and a display apparatus having the array substrate, a pixel part includes gate lines, data lines and pixels electrically connected to the gate and data lines. A gate driving circuit is electrically connected to a first end of the gate lines and applies a gate signal to the gate lines. A first inspecting circuit is electrically connected to odd-numbered gate lines of the gate lines and inspects odd-numbered pixels connected to the odd-numbered gate lines. A second inspecting circuit is electrically connected to even-numbered gate lines of the gate lines and inspects even-numbered pixels connected to the even-numbered gate lines. Thus, electrical defects between the pixels may be easily detected, thereby improving the inspectability for the defects of the array substrate.
REFERENCES:
patent: 5546013 (1996-08-01), Ichioka et al.
patent: 6392719 (2002-05-01), Kim
patent: 6734925 (2004-05-01), Lee et al.
patent: 6839121 (2005-01-01), Kim et al.
MacPherson Kwok & Chen & Heid LLP
Nguyen Vinh P
Samsung Electronics Co,. Ltd.
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