Arrangements for self-measurement of I/O specifications

Details Arrangements for self-measurement of I/O specifications Arrangements for self-measurement of I/O specifications

2006-04-25

2006-04-25

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C370S249000

Reexamination Certificate

active

07036055

ABSTRACT:
Arrangements (circuits, methods, systems) having self-measurement of input/output (I/O) specifications (e.g., input trip-point, output drive-level and pin leakage).

REFERENCES:
patent: 5621739 (1997-04-01), Sine et al.
patent: 6040714 (2000-03-01), Klein

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