Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...
Reexamination Certificate
2005-05-10
2005-05-10
Le, Don (Department: 2819)
Electronic digital logic circuitry
Multifunctional or programmable
Having details of setting or programming of interconnections...
C716S030000
Reexamination Certificate
active
06891395
ABSTRACT:
Disclosed are methods for utilizing programmable logic devices that contain at least one localized defect. Such devices are tested to determine their suitability for implementing selected designs that may not require the resources impacted by the defect. If the FPGA is found to be unsuitable for one design, additional designs may be tested. The test methods in some embodiments employ test circuits derived from a user's design to verify PLD resources required for the design. The test circuits allow PLD vendors to verify the suitability of a PLD for a given user's design without requiring the PLD vendor to understand the user's design.
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Cho Jae
Ling Zhi-Min
Patrie Robert D.
Tong Vincent L.
Toutounchi Shahin
Kanzaki Kim
Le Don
Xilinx , Inc.
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