Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-15
2007-05-15
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C714S032000, C714S033000, C714S725000, C714S742000, C324S526000, C324S537000
Reexamination Certificate
active
10815483
ABSTRACT:
Described are methods for implementing customer designs in programmable logic devices (PLDs). The defect tolerance of these methods makes them particularly useful with the adoption of “nanotechnology” and molecular-scale technology, or “molectronics.” Test methods identify alternative physical interconnect resources for each net required in the user design and, as need, reroute certain signal paths using the alternative resources. The test methods additionally limit testing to required resources so devices are not rejected as a result of testing performed on unused resources. The tests limit functional testing of used resources to those functions required in the user designs.
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Bapat Shekhar
Lai Andrew W.
Patrie Robert D.
Trimberger Steven M.
Wells Robert W.
Behiel Arthur J.
Kik Phallaka
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