Application of statistical inference to optical time domain...

Details Application of statistical inference to optical time domain... Application of statistical inference to optical time domain...

2007-08-14

2007-08-14

Nguyen, Tu T. (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

11434357

ABSTRACT:
The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array.

REFERENCES:
patent: 5066118 (1991-11-01), Buerli
patent: 5069544 (1991-12-01), Buerli

Affiliated with

Also associated with

Rating

Application of statistical inference to optical time domain... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Application of statistical inference to optical time domain..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Application of statistical inference to optical time domain... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3839145