Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate
2008-06-23
2011-11-08
Nguyen, Than (Department: 2188)
Electrical computers and digital processing systems: memory
Storage accessing and control
Specific memory composition
C711S165000
Reexamination Certificate
active
08055835
ABSTRACT:
An apparatus, system, and method are disclosed for migrating wear spots in solid-state drives. A count module counts lifetime write cycles for logical units of a plurality of solid-state memories. Each logical unit has a logical address. An identification module identifies a wear spot on a first logical unit of a first solid-state memory if a count for the first logical unit exceeds a cycle threshold. A migration module dynamically migrates data of the first logical unit to a second solid-state memory, wherein the data is continuously available at an original logical address.
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Ash Kevin John
Donie Benjamin Jay
Koster Andreas Bernardus Mattias
International Business Machines - Corporation
Kunzler Needham Massey & Thorpe
Nguyen Than
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