Apparatus, method, and program for verifying logic circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C703S019000

Reexamination Certificate

active

07840924

ABSTRACT:
A verification apparatus that can verify a circuit in a shorter time while taking possible metastability into consideration. A clock domain crossing (CDC) detector finds CDC paths between circuit elements operating with different clocks in the circuit. A delay generator inserter produces a delay-insertable version of the circuit by embedding a delay generator into each found CDC path. When activated, those delay generators give a signal delay to the corresponding CDC paths. A simulator simulates the behavior of the delay-insertable circuit by using a specified simulation pattern while deactivating the embedded delay generators. A delay pattern generator creates a delay pattern from simulation results, which activates or deactivates delay generators individually so as to produce signal delays that could affect output signals of the circuit. A verifier verifies the circuit by applying the delay pattern to each delay generator in the circuit.

REFERENCES:
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patent: 7197582 (2007-03-01), Chelcea et al.
patent: 7356789 (2008-04-01), Ly et al.
patent: 7594211 (2009-09-01), Tian et al.
patent: 2002/0199173 (2002-12-01), Bowen
patent: 2005/0268265 (2005-12-01), Ly et al.
patent: 2001-229211 (2001-08-01), None
patent: 2005-031890 (2005-02-01), None
patent: 2005-284426 (2005-10-01), None
“Clock Domain Crossings (CDC)”, http://www.metorg.co.jp.techpaper/cdc/index.html.
“O-In Clock-Domain Crossing”, Advanced Verification and Debugging DataSheet, http://www.mentorg.co.jp.

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