Apparatus for X-ray testing long wave infrared radiation detecto

Details Apparatus for X-ray testing long wave infrared radiation detecto Apparatus for X-ray testing long wave infrared radiation detecto

1988-12-27

1990-03-27

Howell, Janice A.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

378207, G01N 2300

Patent

active

049123300

ABSTRACT:
An apparatus for testing infrared detector response to ionizing radiation within an infrared shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope (SEM). The SEM generates an electron beam which propagates through the aperture and is absorbed by a foil positioned adjacent the detector. The interaction of the electron beam with the foil produces X-rays which irradiate the detector. Instruments electrically coupled to the detector record and display the detector response.

REFERENCES:
Flesner et al., "Electron--Beam Apparatus for Testing LWIR Detectors . . . , IEEE Nucl. Science, vol. NS--23, #6, (Dec. 87), p. 1602.
Cohen et al., "SEM Irradiation for Hardness Assurance . . . ", IEEE Nucl. Science, vol. NS--2, (Dec. 74), p. 387.

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