Apparatus for testing semiconductor laser devices

Details Apparatus for testing semiconductor laser devices Apparatus for testing semiconductor laser devices

1994-12-22

1996-03-12

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

356239, G01B 902, G01R 3102

Patent

active

054989736

ABSTRACT:
An apparatus for testing individual ones of semiconductor laser devices of a laser bar during a manufacturing thereof comprises a laser bar chuck for securing the laser bar in a first manner and orientation. A probe is used for probing a laser device of the laser bar. A translational manipulator receives the laser bar chuck and the probe in a second and third manner and orientation, respectively, the manipulator further for translationally positioning the laser bar chuck and the probe independently in a fourth and fifth controlled manner. An energizing means energizes the probe in a sixth controlled manner. A detector detects a lasing of a probed laser device and provides a characteristic output signal representative of a testing characteristic of the probed laser device. Lastly, a controller controls the manipulator and the energizing means in a prescribed manner: (i) in preparation for a testing of a desired one of the laser devices of the laser bar; (ii) during a testing of a desired one of the laser devices of the laser bar; and (iii) upon a completion of the testing of the desired one of the laser devices.

REFERENCES:
patent: 3949295 (1976-04-01), Moorshead
patent: 4489477 (1984-12-01), Chik et al.
patent: 4571077 (1986-02-01), Skeldon

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