Apparatus for testing integrated circuit chips

Details Apparatus for testing integrated circuit chips Apparatus for testing integrated circuit chips

2006-12-19

2006-12-19

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C134S032000

Reexamination Certificate

active

07151386

ABSTRACT:
A test apparatus, for testing electric properties of an integrated circuit, may include: a housing; a chuck on which an integrated circuit is placed as an object of the testing, the chuck being disposed in the housing; a tester part, having a probe needle, to test electric properties of the object, the tester part being attached to the housing; and a cleaning part to clean the probe needle, the cleaning part being disposed in the housing, and the cleaning part including a supporter, a mounting stand removably/attachably coupled to the supporter, and a polishing pad attached to the mounting stand to polish the probe needle.

REFERENCES:
patent: 5220279 (1993-06-01), Nagasawa
patent: 6118290 (2000-09-01), Sugiyama et al.
patent: 6170116 (2001-01-01), Mizuta
patent: 6353221 (2002-03-01), Elings
patent: 6366102 (2002-04-01), Ishimoto
patent: 2002/0149385 (2002-10-01), Miki
patent: 10-209232 (1998-08-01), None
patent: 11-054574 (1999-02-01), None

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