Apparatus for testing integrated circuit

Details Apparatus for testing integrated circuit Apparatus for testing integrated circuit

2007-01-26

2009-06-02

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C324S763010, C360S069000, C360S055000, C369S030270, C369S044110

Reexamination Certificate

active

07543196

ABSTRACT:
An apparatus for testing integrated circuits is disclosed. The apparatus for testing integrated circuits comprises an integrated circuit and a tester. The integrated circuit undergoing testing receives an input signal, and outputs an output signal from a first output terminal or a second output terminal according to a first pulse width of the input signal, and outputs an error signal according to a difference between the first pulse width and a second pulse width. The tester outputs the input signal according to the output signal and the error signal.

REFERENCES:
patent: 4268905 (1981-05-01), Johann et al.
patent: 5200678 (1993-04-01), Tokashiki et al.
patent: 5740137 (1998-04-01), Kim
patent: 6462686 (2002-10-01), Asano et al.

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