Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-07-05
2005-07-05
Dildine, R. Stephen (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Reexamination Certificate
active
06915468
ABSTRACT:
An electronic memory device tester has an input arranged to receive seed data with a first number (p) of seed data bits from a computer and a data generator arranged to receive an array of prepared data having a second number (q) of prepared data bits, where q>p, and arrange to generate from the prepared data a test data pattern for writing to an electronic memory device to be tested. The tester generates its own test pattern thus relieving the computer processor from that task. This in turn allows the computer to control the test cycle itself without compromising the test speed.
REFERENCES:
patent: 4718065 (1988-01-01), Boyle et al.
patent: 4736375 (1988-04-01), Tannhäuser et al.
patent: 5991898 (1999-11-01), Rajski et al.
patent: 6668347 (2003-12-01), Babella et al.
TechEncyclopedia entry “state machine” copyright© 1981-2005 The Computer Language Company Inc. URL:http://www.techweb.com/encyclopedia/defineterm.jhtml;jsessionid=JRNYKEFXMAKZSQSNDBCSKHOCJUMEKJVN?term=state+machine+&x=13&y=10.
C. A. Papachristou, F. Martin, M. Nourani; Microprocessor based testing for core-based system on chip; Jun. 1999; Proceedings of the 36th ACM/IEEE conference on Design automation; pp 586-591.
UK Search Report application No. GB0019518.0, mailed Feb. 5, 2002.
Chambers Adam Richard Maurice
Simmonds Malcolm George
Kivlin B. Noäl
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Microsystems Inc.
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