Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1984-05-31
1987-01-27
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
209573, 324 73R, G01R 3128, B07C 500
Patent
active
046396640
ABSTRACT:
In accordance with a broad aspect of the invention, a system is presented for parametrically and functionally testing integrated circuit devices in parallel. At least one integrated circuit device receiving channel is provided for defining a plurality of integrated circuit device test stations therealong, and means are provided for delivering parametric and functional test signals at least functionally in parallel to each of the integrated circuit device test stations. Means are provided at each test station for selectively engaging the integrated circuit devices to apply the parametric and functional test signals to the integrated circuit device at that station, and to selectively isolate the device from the test signals. Means are provided for receiving an output from each test location in response to the test signals, and means for determining from the output the parameters of each tested integrated circuit device. In accordance with the invention, means are provided for sorting the tested integrated circuit devices according to their measured or tested parameters.
REFERENCES:
patent: 4509008 (1985-04-01), Das Gupta et al.
Lawrence, Jr., J. D.; "Parallel Test with . . . "; Microelectronic Manufacturing and Testing; Jan. 1982; pp. 22-25.
Loranger, A.; "The Hot Aspects of Burn-In"; Electronics Test; Feb. 1984; pp. 40-42, 46, 48, 50, 52.
Parallel Systems Advertisement; "Parallel/Multi-Test Site . . . "; Parallel Systems, Santa Clara, Calif. 95051; no date.
Sym-Tek Systems, Inc. Advertisement; "System 340 QUAD"; Sym-Tek Systems, Inc., San Diego, Ca. 92123; no date.
Daymarc Corporation Advertisement; "Daymarc '757 Quadsite"; Daymarc Corporation, Waltham, Mass. 02154; no date.
Parallel Systems Advertisement; "Introducing the 24 Test . . . "; Parallel Systems, Santa Clara, Calif. 95051; no date.
Allison Mark D.
Chiu Anthony M.
Ho Fock San
Jones James W.
Trammell Lyndale A.
Bachand Richard A.
Karlsen Ernest F.
Merrett N. Rhys
Sharp Melvin
Texas Instruments Incorporated
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