Apparatus for testing a nonvolatile memory and a method thereof

Details Apparatus for testing a nonvolatile memory and a method thereof Apparatus for testing a nonvolatile memory and a method thereof

2006-10-10

2009-06-30

Tran, Michael T (Department: 2827)

Static information storage and retrieval

Addressing

Sync/clocking

C365S189050

Reexamination Certificate

active

07554879

ABSTRACT:
An apparatus for testing or programming a nonvolatile memory in a micro control system and a method thereof is provided. The micro control system comprises: a nonvolatile memory for storing data; an address register for storing an address; a data register for storing serial data; control logic for controlling the nonvolatile memory, the address register and the data register; a clock pin for receiving a clock; a data pin for receiving serial data synchronized with the clock; and a timer for measuring time.

REFERENCES:
patent: 7213185 (2007-05-01), Barone et al.
patent: 2002/0129195 (2002-09-01), Hongo et al.
patent: 2004/0042331 (2004-03-01), Ikehashi et al.
patent: 2004/0085814 (2004-05-01), Kawai et al.

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