Apparatus for supporting semiconductor devices during testing

Details Apparatus for supporting semiconductor devices during testing Apparatus for supporting semiconductor devices during testing

2004-04-22

2009-02-03

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

07486092

ABSTRACT:
An apparatus supports, during a testing operation, a leadframe formed with at least one row of non-singulated semiconductor devices. The apparatus includes a main body and a leadframe support member, and the leadframe support is formed with at least one groove for receiving semiconductor devices such that in use leads extending from the semiconductor devices lie on a surface of the support member.

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