4. Material or article handling
  5. Load carried along a horizontal linear path
  6. Having gripper means

Lap Kei Chow

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Apparatus and method for testing semiconductor devices

Material or article handling – Load carried along a horizontal linear path – Having gripper means
Reexamination Certificate

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Apparatus for supporting semiconductor devices during testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2757134

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