Apparatus for replacing defective cells in a memory device

Static information storage and retrieval – Read/write circuit – Bad bit

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Details

36523006, 3652257, G11C 800

Patent

active

056711859

ABSTRACT:
A method and apparatus for effecting repair or replacement of defective circuits in a solid state memory chip includes locating all the spare cells on one block. A circuit for switching redundancy spare cells in place of main wordline cells includes a first portion for providing a first output whenever both inputs are present and a second output at all other times, the first input that is always present and a second input that is present whenever repair is not selected, a second portion having a first input connected to the output of the first portion and a second input that is absent when repair is indicated, the second portion having a first output whenever one of the inputs is present and a second output whenever neither input is present, a third portion connected to the output of the first portion through a circuit that inverts the value of the output from the first portion and a second input that is present when repair is indicated, the third portion producing a first output whenever both inputs are present and a second output at all other times.

REFERENCES:
patent: 5473573 (1995-12-01), Rao
patent: 5475648 (1995-12-01), Fujiwara

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