Apparatus for processing negative photoresist

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

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2504922, G01N 2300, G01N 2100

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active

045089680

ABSTRACT:
A negative photoresist emulsion, wherein after a film of negative photoresist emulsion on a substrate has been exposed for pattern writing in vacuum to charged particle beams or soft X-ray beams, the film-coated substrate is transferred to, and kept in, a chamber filled with non-oxidizing gas, and then the substrate is removed to the outside atmosphere. By this method, a curing effect of the photoresist film is prevented, enabling formation of fine patterns with precision. An apparatus for carrying out the above method has a gas chamber filled with non-oxidizing gas connected to an exposure chamber, and the substrate, after such exposure, is kept in an atmosphere of non-oxidizing gas in the gas chamber before being removed to the outside atmosphere. In either the above-method or apparatus, the concentration of oxygen in the non-oxidizing gas must be less than 5%, preferably less than 1%.

REFERENCES:
patent: 3643058 (1972-02-01), Long
patent: 4185202 (1980-01-01), Dean et al.
patent: 4239787 (1980-12-01), Rentschler
patent: 4298803 (1981-11-01), Matsuura et al.
NHK Laboratories Note, No. 253, dated Aug. 1980, Tokyo, pp. 3-14.

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