Apparatus for measuring thickness of coating on continuously mov

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source

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2503591, 2503601, G01N 23225

Patent

active

044517327

ABSTRACT:
Apparatus using radiation techniques for measuring coating thickness on continuously moving strip material as it travels along a predetermined path and without altering that path. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided in the path of the strip for reciprocation along a preselected segment of the path. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the direction of travel of the strip during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism. The shuttle includes a strip guide plate which is tiltable about an axis substantially parallel to the longitudinal axis of the strip in order to orient the surface having the coating so it can be properly presented to the measuring probe.

REFERENCES:
patent: 3115577 (1963-12-01), Joffe et al.
patent: 3125680 (1964-03-01), Schlaechter
patent: 3132248 (1964-05-01), Eggebraaten et al.
patent: 3529158 (1970-09-01), Joffe et al.
patent: 4383172 (1983-05-01), Holler et al.
"Continuous Strip Monitor", UPA Technology, Inc. (brochure).
"Strip Monitor", Materials Evaluation, Sep. 1978, pp. 87-88, (Magazine Article).
"Betascope CC950 Cont", Fischer Instrumentation (brochure).

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