Apparatus for mass-producing silicon-based thin film and...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S771000, C438S788000, C257SE21269

Reexamination Certificate

active

07927982

ABSTRACT:
A silicon-based thin film mass-producing apparatus, including transparent electrodes placed to face in parallel to corresponding counter electrodes with a space therebetween, and silicon-based thin films are deposited on the transparent electrodes by feeding a raw material gas for depositing the silicon-based thin films into the chamber and by applying a DC pulse voltage to the counter electrodes to generate plasma. Unlike methods in which a radio frequency voltage is intermittently applied to perform discharge, a high plasma density distribution does not occur, and in-plane film thickness distribution does not occur. Furthermore, since the DC pulse voltage rises sharply, the ON period can be shortened. As a result, generation of a sheath ceases in the transient state before reaching the steady state, and the thickness of the sheath is small, which allows the space between the counter and transparent electrodes to decrease.

REFERENCES:
patent: 2002/0056415 (2002-05-01), Mashima et al.
patent: 2004/0161534 (2004-08-01), Saito et al.
patent: 2000-223424 (2000-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for mass-producing silicon-based thin film and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for mass-producing silicon-based thin film and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for mass-producing silicon-based thin film and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2636570

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.