Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2011-04-19
2011-04-19
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S771000, C438S788000, C257SE21269
Reexamination Certificate
active
07927982
ABSTRACT:
A silicon-based thin film mass-producing apparatus, including transparent electrodes placed to face in parallel to corresponding counter electrodes with a space therebetween, and silicon-based thin films are deposited on the transparent electrodes by feeding a raw material gas for depositing the silicon-based thin films into the chamber and by applying a DC pulse voltage to the counter electrodes to generate plasma. Unlike methods in which a radio frequency voltage is intermittently applied to perform discharge, a high plasma density distribution does not occur, and in-plane film thickness distribution does not occur. Furthermore, since the DC pulse voltage rises sharply, the ON period can be shortened. As a result, generation of a sheath ceases in the transient state before reaching the steady state, and the thickness of the sheath is small, which allows the space between the counter and transparent electrodes to decrease.
REFERENCES:
patent: 2002/0056415 (2002-05-01), Mashima et al.
patent: 2004/0161534 (2004-08-01), Saito et al.
patent: 2000-223424 (2000-08-01), None
Imaeda Minoru
Imanishi Yuichiro
Saito Takao
Burr & Brown
Ghyka Alexander G
NGK Insulators Ltd.
Nikmanesh Seahvosh J
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