Geometrical instruments – Gauge – Collocating
Reexamination Certificate
2006-06-27
2006-06-27
Guadalupe, Yaritza (Department: 2859)
Geometrical instruments
Gauge
Collocating
C033S613000, C033S645000
Reexamination Certificate
active
07065894
ABSTRACT:
An improved reticle frame structure surrounds the perimeter of a reticle substrate and contacts it at the edge with precision guidance surfaces as the reticle is lowered onto the device. In an embodiment, the reticle contacts conical sections that correct its position and orientation along the plane of its mask surface, and spherical surfaces to position the reticle at its standardized datum reference areas. Near the intersection of the X and Y reference planes, a minimal area of the reticle face comes to rest on a spherical mounting surface as far away from the reticle mask as possible. This surface completes a tripod of vertical support in conjunction with the cones, which maintain contact with the reticle edges only. Secondary and tertiary spherical support surfaces can be provided for vertical support of the other two lateral corners of the reticle face to mitigate reticle tilt while it is being lowered onto the tripod contact points.
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ASML Holding N.V.
Guadalupe Yaritza
Sterne, Kessler, Goldstein & Fox P.L.L.C
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