Apparatus for examination by scattered radiation

Details Apparatus for examination by scattered radiation Apparatus for examination by scattered radiation

1982-05-03

1984-10-30

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 6, G01M 2320

Patent

active

044803320

ABSTRACT:
The invention relates to an apparatus for imaging a layer of a body to be examined. The body is irradiated by primary radiation, in response to which the layer emits scattered radiation. The apparatus comprises a diaphragm plate which is disposed outside the primary radiation beam. The diaphragm is rotatable about an axis perpendicular to its major surface, and it has at least one aperture which is disposed off of the axis of rotation. A detector or a superposition device is provided for measuring or superimposing the scattered radiation which passes through the diaphragm plate at different aperture settings. The primary radiation is stopped down to form a flat fan-shaped beam. The diaphragm plate is oriented parallel to the fan-shaped beam. Each aperture corresponds to an associated detector, which follows the rotation of the diaphragm plate. The input face of each detector extends parallel to the diaphragm plate. The detector is arranged so as to be rotatable about a detector axis which is perpendicular to an input face and which extends through its center. The detector rotates in a direction opposite to the direction of rotation of the diaphragm plate and with the same angular velocity as this plate.

REFERENCES:
patent: 3852603 (1974-12-01), Muehllehner
patent: 4124804 (1978-11-01), Merell
patent: 4380817 (1983-04-01), Harding

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