Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-01-25
2005-01-25
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06848096
ABSTRACT:
An apparatus for correcting layout pattern data composed of a computer system includes eight sections. The first section holds the layout pattern data. The second section holds correcting requirements. The third section extracts and divides correction target edges of the layout pattern. The fourth section sets a permissible correction range. The fifth section extracts insufficient process margin parts. The sixth section resets the permissible correction range. The seventh section performs correction by simulation. The eighth section holds finished correction layout pattern data. By simulation, the apparatus predicts finished layout patterns at high rate and high precision within the movable range of the correction target edges which can secure process margins.
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Calibre WORKbench and LITHO Commands Reference Manualv.8.8_11 (Jun. 2001) pp. 3:51-3:52.
“Customizing Proximity Correction for Process-Specific Objectives” Michael L. Rieger, et al.SPIEvol. 2726 (1996).
McDermott Will & Emery LLP
Renesas Technology Corp.
Siek Vuthe
Tat Binh
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