Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Output switching noise reduction
Reexamination Certificate
2007-05-29
2007-05-29
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Output switching noise reduction
C326S027000, C326S030000, C326S087000
Reexamination Certificate
active
11016528
ABSTRACT:
The present invention relates to an apparatus for adjusting a slew rate of a data signal outputted by a signal from an external circuit in a semiconductor memory device and a method therefor. The apparatus includes: a slew rate control signal generation block for outputting a plurality of slew rate control signals through combining control codes inputted from the external circuit in response to a command signal; and a data buffer for adjusting a slew rate of a data signal inputted by using the slew rate control signals.
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Hynix / Semiconductor Inc.
Tran Anh Q.
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